☆ 4.5 Article

Crystal structure analysis under uniaxial strain at low temperature using a unique design of four-axis x-ray diffractometer with a fixed sample

REVIEW OF SCIENTIFIC INSTRUMENTS (2005)

Rate this paper

The primary rating indicates the level of overall quality for the paper. Secondary ratings independently reflect strengths or weaknesses of the paper.

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Crystal structure analysis under uniaxial strain at low temperature using a unique design of four-axis x-ray diffractometer with a fixed sample

Rate this paper

Discover Peeref hubs

Add your recorded webinar

Export Citation

Share Paper