Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 76, Issue 9, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2001607
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For the purpose of crystal structure analysis under uniaxial strain at low temperatures, we developed a pressure cell for uniaxial compression and a unique design of an x-ray diffractometer wherein both the x-ray source and the detector are capable of two-axial rotation with a fixed sample. This arrangement is advantageous to crystal structure analyses under extreme conditions that require a large and heavy apparatus. Using the present diffractometer, we performed the crystal structure analyses of the organic conductor, alpha-(BEDT-TTF)(2)I-3 (BEDT-TTF denotes bis(ethylene)dithio-tetrathiafulvalene), under uniaxial strain and ambient pressure, and at room and low temperatures, and obtained results that were qualitatively consistent with those of resistivity measurements. (c) 2005 American Institute of Physics.
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