Journal
PHYSICAL REVIEW B
Volume 72, Issue 11, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.72.113415
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We have measured the low frequency (1 mHz <= f <= 10 Hz) resistance fluctuations in metallic nanowires (diameter 15 nm to 200 nm) in the temperature range 77 K to 400 K. The nanowires were grown electrochemically in polycarbonate membranes and the measurements were carried out in arrays of nanowires by retaining them in the membrane. A large fluctuation in excess of conventional 1/f noise which peaks beyond a certain temperature was found. The fluctuations with a significant low frequency component (similar or equal to 1/f(3/2)) arise when the diameter of the wire similar or equal to 15 nm and vanish rapidly as the diameter is increased. We argue that Rayleigh-Plateau instability is the likely cause of this excess noise.
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