Journal
MICROPOROUS AND MESOPOROUS MATERIALS
Volume 84, Issue 1-3, Pages 332-337Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.micromeso.2005.05.043
Keywords
crack formation; MFI zeolite membrane; negative thermal expansion; thin film stress; thermal behavior
Ask authors/readers for more resources
Temperature-resolved in situ synchrotron X-ray diffraction is used for the first time to study the microstructure evolution of a preferentially oriented zeolite membrane (siliceous ZSM-5) during calcination of the organic structure directing agent (tetrapropyl ammonium, TPA). Use of transmission sample geometry allowed us to discriminate in-plane from out-of-plane reflections and to calculate strain imposed on the zeolite layer along the in-plane (parallel to the support) as well as the out-of-plane (perpendicular to the support) direction over the entire calcination process. The results strongly suggest that the zeolite crystals of the membrane are under compressive in-plane stress and that their thermal behavior is quite different from free standing powder. (c) 2005 Elsevier Inc. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available