Journal
JOURNAL OF APPLIED PHYSICS
Volume 98, Issue 6, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2014938
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Conductive-atomic force microscopy has been used to perform nanoscale current imaging of Ni-ion-implanted polythylene terephthlate films. A reduction in bulk sheet resistivity, as the Ni dose is increased, is found to be accompanied by an evolution in local conductivity from a spatially homogeneous insulator to an interconnected network of conducting Ni crystallites. The crystallites have a mean dimension of 12.3 nm, confirmed by x-ray-diffraction analysis. (c) 2005 American Institute of Physics.
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