4.7 Article Proceedings Paper

Spectroscopic infrared scanning near-field optical microscopy (IR-SNOM)

Journal

JOURNAL OF ALLOYS AND COMPOUNDS
Volume 401, Issue 1-2, Pages 80-85

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2005.02.057

Keywords

SNOM; NSOM; infrared spectroscopy; BN; cells; thin film

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Scanning near-field optical microscopy (SNOM or NSOM) is the technique with the highest lateral optical resolution available today, while infrared (IR) spectroscopy has a high chemical specificity. Combining SNOM with a tunable IR source produces a unique tool, IR-SNOM, capable of imaging distributions of chemical species with a 100 rart spatial resolution. We present in this paper boron nitride (BN) thin film images, where IR-SNOM shows the distribution of hexagonal and cubic phases within the sample. Exciting potential applications in biophysics and medical sciences are illustrated with SNOM images of the distribution of different chemical species within cells. We present in this article images with resolutions of the order of lambda/60 with SNOM working with infrared light. With our SNOM setup, we routinely get optical resolutions between 50 and 150 nm, regardless of the wavelength of the light used to illuminate the sample. (c) 2005 Elsevier B.V. All rights reserved.

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