4.6 Article

Comparative study of thermally conductive fillers in underfill for the electronic components

Journal

DIAMOND AND RELATED MATERIALS
Volume 14, Issue 10, Pages 1647-1653

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.diamond.2005.05.008

Keywords

composites; thermal properties; electronic device structures; diamond underfill

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General underfill for the flip-chip package had a low thermal conductivity of about 0.2 W/mK. Thermal properties of underfill were measured with various fillers, such as silica, alumina, boron nitride, (BN) and diamond. Coefficient of thermal expansion (CTE) was changed by filler content and CTE of silica 60 wt.% was 28 ppm; BN 30 wt.%, 25 ppm; alumina 60 wt.%, 39 ppm; and diamond 60 wt.%, 24 ppm. The viscosity of underfill was measured with the cone and plate rheometer. Thermal diffusivity was measured with the laser flash method. Diamond filler loaded underfill showed the highest thermal conductivity 60 wt.%; 1.17 W/mK at 55 degrees C. Thermal conductivity of underfill was changed with a transition of heat capacity by the temperature increment in same filler content. In case of different filler content, thermal conductivity was changed with a transition of the thermal diffusivity. (c) 2005 Elsevier B.V. All rights reserved.

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