Journal
APPLIED PHYSICS LETTERS
Volume 87, Issue 15, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2099526
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The stability of a conductive thin film on a dielectric substrate subjected to a transverse electric field and a residual strain is analyzed. Under a uniform electric field, an equilibrium state exists with a constant thickness reduction of the substrate. The equilibrium state, however, can be unstable, depending on the intensity of the electric field, the stiffness, and Poisson's ratio of the substrate, and on the residual strain in the film. Based on a linear perturbation analysis, the critical condition is determined, beyond which wrinkling of the film is expected. (C) 2005 American Institute of Physics.
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