Journal
STOCHASTIC PROCESSES AND THEIR APPLICATIONS
Volume 115, Issue 11, Pages 1860-1882Publisher
ELSEVIER
DOI: 10.1016/j.spa.2005.06.007
Keywords
Bisous model; three-dimensional spatial patterns; marked point process; object point process; Markov chain Monte Carlo simulation; simulated annealing; cooling schedules; stochastic optimization
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This paper introduces a three-dimensional object point process-the Bisous model-that can be used as a prior for three-dimensional spatial pattern analysis. Maximization of likelihood or penalized-likelihood functions based on this model requires global optimization techniques, such as the simulated annealing algorithm. Theoretical properties of the model are discussed and the convergence of the proposed optimization method is proved. Finally, a simulation study is presented. (c) 2005 Elsevier B.V. All rights reserved.
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