High-resolution soft X-ray emission spectrograph at advanced light source

The progress of valence electronic spectroscopy with X-rays has been largely limited by the challenge of fine instrumentation. Relatively weak scattering cross-section and/or limited (coarse) energy resolution restrict X-ray spectroscopy to address fundamental issues in condensed-matter electron physics. Depending on the nature of excitations, high brightness photon beam from third-generation synchrotron facilities helps raise the count rates to a detectable limit over the noise level. Over the past decade, it has been realized that high-resolution resonant inelastic soft X-ray scattering has the potential to play an important role in understanding complex phenomena observed in highly correlated systems. Driven by such demand, we have developed a soft X-ray emission spectrograph based on variable line spacing (VLS) gratings to work in the soft X-ray and deep UV (the M edge of transition metals) regime. The slit-less design coupled with high quality optical elements and a high quantum efficiency (QE) in-vacuum CCD detector greatly improves the overall throughput. The M edge spectrograph has been demonstrated to have a resolving power better than 10,000 and will be used in conjunction with meV-resolution beamline (MERLIN) at the Advanced Light Source at Lawrence Berkeley National Laboratory. (c) 2005 Elsevier Ltd. All rights reserved.