Journal
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Volume 53, Issue 12, Pages 3731-3734Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMTT.2005.856085
Keywords
cables; delay effects; measurement errors; millimeter-wave measurements
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In millimeter-wave applications, it is sometimes required to measure waveguide components that are several hundred wavelengths long. Depending on the vector network analyzer calibration technique used, the distance between the generator and receiver can be much longer than the one used during calibration when the device-under-test is inserted. If the frequency is swept or drifting, a systematic error is known to appear. A simple way of correcting the result combining two measurements was found.
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