Journal
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 54, Issue 6, Pages 2540-2548Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2005.858541
Keywords
coordinate measuring machine (CMM); dimensional metrology; one-stage and two-stage probes; probing accuracy
Ask authors/readers for more resources
The analysis of probe operational parameters such as configuration of the probe, including triggering (measuring) force, stiffness, and length of the stylus, has been performed. A new method allowing three-dimensional (3-D) probe error characteristics with several times more accuracy than the procedure used on a coordinate measuring machine (CMM) has been applied. The analyses have been performed for devices of two types: a single-stage and a two-stage switching probe. The influence of the above-mentioned parameters has been analyzed theoretically and verified experimentally in two planes: perpendicular and parallel to the probe axis. Good agreement between the proposed theoretical model and experimental data has been obtained.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available