Journal
APPLIED SURFACE SCIENCE
Volume 252, Issue 5, Pages 1502-1509Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2005.02.132
Keywords
spray pyrolysis; X-ray diffraction; dielectric properties; scanning electron microscopy; Rutherford back scattering
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Thin films of lanthanum sulphide (La2S3) have been deposited onto glass substrates by spray pyrolysis technique from nonaqueous (methanol) medium. The structural, morphological, optical, dielectric, electric and thermoemf properties were studied. The films were polycrystalline with an irregular shaped particles present over the porous structure within a fibrous network structure. The optical band gap was estimated to be 2.50 eV. The dielectric properties were measured in the range 100 Hz-1 MHz. The electrical resistivity was of the order of 10(4) to 10(5) Omega cm. Thermoemf study revealed that the La2S3 films exhibit p-type electrical conductivity. (c) 2005 Elsevier B.V. All rights reserved.
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