Journal
APPLIED PHYSICS LETTERS
Volume 87, Issue 26, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2144279
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Scanning transmission electron microscopy and electron energy loss spectroscopy have been applied to investigate the possible structural origins of ferroelectric polarization degradation at PbTiO3/Pt interfaces. The microscopic analysis revealed that an amorphous Ti-rich interfacial layer as well as nanometer size precipitates was formed at PbTiO3/Pt interfaces. The interfacial layer appears to form through decomposition of the PbTiO3 film due to a ferroelectric-electrode reaction during Pt deposition. The formation of the interfacial layer and precipitates could contribute to the polarization degradation typically observed for Pt-electroded PbTiO3-based ferroelectric capacitors. (c) 2005 American Institute of Physics.
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