Journal
APPLIED PHYSICS LETTERS
Volume 88, Issue 4, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2167805
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We propose and demonstrate a scheme for two-dimensional terahertz reflection imaging using a time-domain phase-retrieval algorithm based on the dispersion relations of complex reflection coefficients. With this scheme, topographic images-as well as the dielectric functions of a structured sample-can be obtained. A composite sample made of a semiconductor and metals is characterized within depth and lateral errors of 50 mu m and 100 mu m. (c) 2006 American Institute of Physics.
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