Statistical analysis of lifetime distribution for optical recordable disks

In this study, we examine the criteria for lifetime measurements using the Eyring acceleration test model and statistical analyses to evaluate high-density recordable optical disks. Two criteria are commonly used to determine disk lifetimes. One is the parity inner (PI) error number of the error correction code (ECC). The other is the jitter value (the channel clock to data). The results have demonstrated that the statistical distribution of lifetime data using jitter is a lognormal distribution. Using this criterion, we can estimate the standard life expectancy of high-density recordable optical disks as the minimum lifetime of 95% survival probability at a 95% confidence level.