Journal
SCRIPTA MATERIALIA
Volume 54, Issue 3, Pages 333-336Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2005.09.052
Keywords
amorphous metallic glass; high-resolution electron microscopy; crystallization; shear bands; nanovoids
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Transmission electron microscopy (TEM) studies on mechanically-induced nanocrystallization in amorphous alloys are reviewed briefly. Using a recently-developed, quantitative, high-resolution TEM method, defects in deformed, Al-based, amorphous, alloys were observed and related to mechanically-induced nanocrystallization. Deformation-assisted atomic transport and the resulting nanocrystallization are discussed. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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