Journal
IEEE ELECTRON DEVICE LETTERS
Volume 27, Issue 2, Pages 111-113Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2005.863147
Keywords
amorphous-silicon (a-Si); device stability; flexible; plastic substrate; thin-film transistor (TFT)
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Amorphous-silicon (a-Si) thin-film transistors (TFTs) were fabricated on a free-standing new clear plastic substrate with high glass transition temperature (T-g) of > 315 degrees C and low coefficient of thermal expansion of < 10 ppm/degrees C. Maximum process temperatures on the substrates were 250 degrees C and 280 degrees C, close to the temperatures used in industrial a-Si TFT production on glass substrates. The first TFTs made at 280 degrees C have dc characteristics comparable to TFTs made on glass. The stability of the 250 degrees C TFTs on clear plastic is approaching that of TFTs made on glass at 300 degrees C-350 degrees C. TFT characteristics and stability depend only on process temperature and not on substrate type.
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