Journal
SENSORS AND ACTUATORS A-PHYSICAL
Volume 127, Issue 1, Pages 155-162Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.sna.2005.11.018
Keywords
micro-electro-mechanical systems (MEMS) force sensor; post buckling phenomenon; non-linear stiffness; displacement amplification; compliant mechanism
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In this paper we present a novel MEMS force sensor that exploits the post-buckling phenomenon of slender silicon columns. The design philosophy and fabrication process is discussed and analytical expressions for the force-displacement characteristics are developed. The sensor can be used to perform quantitative and qualitative measurements in-situ in SEM, TEM or STM, where the small chamber size makes it challenging to integrate conventional force-displacement sensors. Potential applications for the sensor are characterization of carbon nanotube-polymer interfaces, nanoscale thin film testing and mechanical testing of single biological cells. (c) 2005 Elsevier B.V. All rights reserved.
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