Journal
PHYSICAL REVIEW E
Volume 73, Issue 3, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevE.73.031406
Keywords
-
Categories
Ask authors/readers for more resources
The thin interface layer on colloids in a liquid can be characterized by applying nulling ellipsometry to a scattering experiment. Close to 90 degrees scattering angle the ellipsometric quantities tan(Psi) and Delta of particles smaller than the wavelength behave like at the Brewster angle of reflection ellipsometry. The minimum of tan(Psi) and the slope of Delta depend on thickness and refractive index of the layer, while the location of the minimum is sensitive to the refractive index of the particle. As an example, the swelling of a thermosensitive layer on colloidal particles has been determined from measurements at two wavelengths.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available