Photovoltage mapping on polycrystalline silicon solar cells through potential measurements by atomic force microscopy with piezoresistive cantilever

The local distribution of photovoltalges on polycrystalline silicon solar cells were investigated through potential measurements by atomic force microscopy with a piezoresistive cantilever operated under light illumination. As a result, a small but not negligible site dependence of pholovoltage was obtained. The estimated difference in power conversion efficiency among grains reached LIP to 18%, although this difference could not be attributed to the difference in reflectance coefficient.