Polarization dependence of L- and M-edge resonant inelastic x-ray scattering in transition-metal compounds -: art. no. 117404

The resonant inelastic x-ray scattering (RIXS) cross section at the L and M edges of transition-metal compounds is studied using an effective scattering operator. The intensities of the elastic peak and for spin-flip processes are derived. It is shown how the polarization dependence can be used to select transitions. Comparisons are made with experiment. A detailed analysis of the polarization and angular dependence of L- and M-edge RIXS for divalent copper compounds, such as the high-T-c superconductors, is given.