Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 21, Issue 4, Pages 501-506Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0268-1242/21/4/015
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HgTe/Hg0.3Cd0.7Te(001) quantum well structures fabricated with a Si-O-N insulator layer and an Au top gate electrode exhibit hysteresis effects in their gate-voltage dependent carrier density and thus a nonlinear variation of the Rashba spin-orbit splitting energy (AR), Charging and discharging of states at the semiconductor insulator interface has been found to be responsible for this effect. The quantitative agreement with a simple capacitor model has been used to identify the maximum hysteresis-free gate-voltage range. A nearly linear variation Of AR with applied gate voltage has been observed in this range.
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