Journal
DIAMOND AND RELATED MATERIALS
Volume 15, Issue 4-8, Pages 559-563Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.diamond.2005.11.053
Keywords
diamond film; nanocrystalline; defect characterization; electrical properties characterization
Ask authors/readers for more resources
Fourier transform photocurrent spectroscopy (FTPS) has been applied to the study of electronic defect states in nanocrystalline diamond films. To analyze the influence of the substrate on submicron-thin nanodiamond films, silicon substrates were compared to low alkaline glass substrates. We have observed four peaks in the photocurrent spectrum of nanocrystalline diamond: two sharp peaks at 0.36 and 0.40 eV and broad bands at 0.27 and 0.57 eV These peaks, observed for films grown on Si substrate, have different behavior with respect to the temperature, external light illumination and absorption/desorption processes at the nanodiamond surface. (c) 2005 Elsevier B.V All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available