Evolution of interface patterns of three-dimensional two-layer liquid films

The structuring process of two-layer liquid films driven by van der Waals interactions is investigated numerically for three-dimensional systems. Different types of dynamical transitions of the interface morphologies are characterised using coupled evolution equations for the thickness profiles. We introduce a global deflection measure that faithfully captures the transitions occurring in the course of the short- and long-time evolution. Using an Si/PMMA/PS/air system as example, transitions via branch switching and via coarsening are analysed in detail.