Journal
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume 300, Issue 1, Pages 206-210Publisher
ELSEVIER
DOI: 10.1016/j.jmmm.2005.10.064
Keywords
exchange bias; X-ray resonant magnetic scattering
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We have used soft X-ray resonant magnetic scattering (XRMS) to search for the presence of an effective ferromagnetic moment belonging to the antiferromagnetic (AF) layer which is in close contact with a ferromagnetic (F) layer. Taking advantage of the element specificity of the XRMS technique, we have measured hysteresis loops of both Fe and CoO layers of a CoO(40 degrees angstrom)/Fe (150 angstrom) exchange bias bilayer. From these measurements we have concluded that the proximity of the F layer induces a magnetic moment in the AF layer. The F moment of the AF layer has two components: one is frozen and does not follow the applied magnetic field and the other one follows in phase the ferromagnetic magnetization of the F layer. The temperature dependence of the F components belonging to the AF layer is shown and discussed. (c) 2005 Elsevier B.V. All rights reserved.
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