Journal
OPTICS LETTERS
Volume 31, Issue 10, Pages 1405-1407Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.31.001405
Keywords
-
Categories
Ask authors/readers for more resources
Combining the concept of lateral shear interferometry (LST) within a digital holography microscope, we demonstrate that it is possible to obtain quantitative optical phase measurement in microscopy by a new single-image-processing procedure. Numerical lateral shear of the reconstructed wavefront in the image plane makes it possible to retrieve the derivative of the wavefront and remove the defocus aberration term introduced by the microscope objective. The method is tested to investigate a silicon structure and a mouse cell line. (c) 2006 Optical Society of America
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available