Journal
PHYSICAL REVIEW LETTERS
Volume 96, Issue 20, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.96.200401
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We propose simple schemes that can perfectly identify projective measurement apparatuses secretly chosen from a finite set. Entanglement is used in these schemes both to make possible the perfect identification and to improve the efficiency significantly. Based on these results, a brief discussion on the problem of how to appropriately define distance measures of measurements is also provided.
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