Journal
JOURNAL OF NON-CRYSTALLINE SOLIDS
Volume 352, Issue 9-20, Pages 1517-1519Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.jnoncrysol.2005.12.026
Keywords
amorphous semiconductors; synchrotron radiation; X-ray diffraction; chalcohalides; medium-range order; short-range order
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Anomalous X-ray scattering experiments have been performed on glassy As2Se3 at room temperature in order to clarify the role of each constituent for short- and intermediate-range order. The experiments were performed using intense X-rays from a third-generation synchrotron facility, ESRF. Differential structure factors, Delta S-i(Q), close to the As and Se K edges were obtained from a detailed analysis. The prepeak around Q = 12 nm(-1) in the total structure factor, S(Q), indicating evidence of intermediate-range order, is dominated by the As-As correlation around 12 nm(-1) and the Se-Se correlation around 14.5 nm(-1). The origin of the prepeak is carefully discussed. (c) 2006 Elsevier B.V. All rights reserved.
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