Verification of some low-Z silicates as gamma-ray shielding materials

G-P fitting method has been used to compute buildup factors of some low atomic number (Z) silicates for the wide energy range (0.015-15.0 MeV) up to the penetration depth of 40 mean free path. The variation of buildup factors with equivalent atomic numbers, penetration depth and incident photon energies for the selected samples has been studied. Among the observations was the inverse relationship between values of buildup factors and equivalent atomic numbers for all samples. It has been concluded that the sample with least equivalent atomic number possesses the maximum value of buildup factor. It has been verified that datolite and diopside can be used as good shielding materials. The results have been depicted graphically with some useful conclusions. (C) 2011 Elsevier Ltd. All rights reserved.