Journal
SOLID STATE IONICS
Volume 177, Issue 17-18, Pages 1443-1449Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ssi.2006.06.024
Keywords
electrostatic spray deposition; IT-SOFCs; electrolyte; thin films; Raman spectroscopy; X-ray diffraction
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Cubic and tetragonal Y2O3-doped ZrO2 thin films were deposited with a dense surface morphology by electrostatic spray deposition. Four dependent process parameters - substrate temperature, precursor solution flow rate, nozzle to substrate distance and the deposition time - have been used to control the process. Temperature dependent Raman spectroscopy and X-ray diffraction were performed in order to investigate the crystallization behavior and structural properties. (c) 2006 Elsevier B.V. All rights reserved.
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