Journal
SCRIPTA MATERIALIA
Volume 55, Issue 1, Pages 23-28Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2006.02.039
Keywords
microstructure; focused ion beam (FIB) microscopy
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Dual beam focused ion beam-scanning electron microscopes are well suited for characterizing micron and sub-micron size microstructural features in three dimensions via serial-sectioning procedures. Importantly, these commercially-available instruments can be used to collect morphological, crystallographic, and chemical information throughout a serial-sectioning experiment. Selected examples are shown to demonstrate these capabilities. (c) 2006 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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