Journal
APPLIED OPTICS
Volume 45, Issue 22, Pages 5642-5650Publisher
OPTICAL SOC AMER
DOI: 10.1364/AO.45.005642
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Reflectance versus incidence angle measurements have been performed from 5 to 152 nm on samples of SiC with a different C/Si ratio deposited with rf magnetron sputtering. The optical constants of the material at different wavelengths have been determined by using a curve-fitting technique of reflectance values versus incidence angle. Complementary measurements of the incident beam polarization, film thickness, surface roughness, and stoichiometry were performed to complete the analysis of the samples. (C) 2006 Optical Society of America.
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