4.6 Article

Elastic behavior of polycrystalline thin films inferred from in situ micromechanical testing and modeling

Journal

APPLIED PHYSICS LETTERS
Volume 89, Issue 6, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.2335779

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Synchrotron x-ray diffraction combined with in situ tensile testing is used to investigate the anisotropic elastic behavior of gold thin films exhibiting a fiber texture and columnar grains. Micromechanical modeling based on the self-consistent model and accounting for both crystallographic and morphological textures is applied. Flat-disk shaped inclusions must be used in the model to reproduce accurately experimental data, owing to the surface effects. (c) 2006 American Institute of Physics.

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