4.5 Article

Surface-mount sapphire interferometric temperature sensor

Journal

APPLIED OPTICS
Volume 45, Issue 24, Pages 6071-6076

Publisher

OPTICAL SOC AMER
DOI: 10.1364/AO.45.006071

Keywords

-

Categories

Ask authors/readers for more resources

A fiber-optic high-temperature sensor is demonstrated by bonding a 45 degrees-polished single-crystal sapphire fiber on the surface of a sapphire wafer, whose optical thickness is temperature dependent and measured by white-light interferometry. A novel adhesive-free coupling between the silica and sapphire fibers is achieved by fusion splicing, and its performance is characterized. The sensor's interference signal is investigated for its dependence on angular alignment between the fiber and the wafer. A prototype sensor is tested to 1170 degrees C with a resolution of 0.4 degrees C, demonstrating excellent potential for high-temperature measurement. (C) 2006 Optical. Society of America.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.5
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available