Journal
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
Volume 67, Issue 9-10, Pages 2007-2012Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.jpcs.2006.05.034
Keywords
ceramics; XAFS (EXAFS and XANES); X-ray diffraction; Raman spectroscopy; defects; radiation damage
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We report the effect of pulsed electron beam irradiation on the long-range and short-range atomic structure, as well as on the Raman phonon modes, of perovskite (Pb1-xLax)(Zr0.65Ti0.35)O-3, x = 0.04 and 0.09 (PLZT 4/65/35 and 9/65/35) ferroelectric ceramics. X-ray powder diffraction (XRD) spectra from the single-pulse-irradiated PLZT 9/65/35 samples reveal transformation of the cubic Pm3m (Z = 1) into the orthorhombic Pmmm (Z = 1) structure. This symmetry change is however not observed for 10-pulse irradiation performed under the same conditions: here only an increase in the coherent scattering regions, lattice volume, and the Zr-O distance distribution is observed, as revealed by XRD and X-ray absorption spectroscopy at Zr K-edge. Raman scattering from PLZT 9/65/35 ceramics is in agreement with the symmetry reduction after single-pulse irradiation and reveals significant Raman signal intensity decrease after multiple-pulse irradiation. On the contrary, no significant structural changes could be detected in PLZT 4/65/35 ceramics after single- or multiple-pulse irradiation. Possible mechanisms of pulsed electron irradiation effects in PLZT 4/65/35 and 9/65/35 ceramics are discussed. (c) 2006 Published by Elsevier Ltd.
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