Grazing-incidence x-ray diffraction study of pentacene thin films with the bulk phase structure

The structure of pentacene thin films in the bulk phase having interplane spacing of d(001)=1.44 nm grown on SiO2 was investigated using grazing-incidence x-ray diffraction. The films were prepared with two different methods: one treated with an organic solvent after vacuum deposition and the other thermally treated. Both films are similar in structure to the single crystal reported by Campbell [Acta Crystallogr. 15, 289 (1962)]. (c) 2006 American Institute of Physics.