Journal
APPLIED PHYSICS LETTERS
Volume 89, Issue 10, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2348781
Keywords
-
Categories
Ask authors/readers for more resources
The authors present a detection technique for scattering-type near-field optical microscopy capable of background interference elimination in the entire near-UV to far-IR spectral range. It simultaneously measures near-field optical signal amplitude and phase by interferometric detection of scattered light utilizing a phase-modulated reference wave. They compare its background suppression efficiency to other known methods and experimentally show that it provides a reliable near-field optical material contrast even in the case where both noninterferometric and homodyne interferometric detection methods fail. (c) 2006 American Institute of Physics.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available