Journal
APPLIED PHYSICS LETTERS
Volume 89, Issue 11, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2349288
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Conductive atomic force microscopy has been used to study the topography and the electric properties of InAs quantum dots (QDs) grown by metal organic vapor phase epitaxy on a n-type InP(001) substrate and covered with a 5 nm thick InP cap layer. Images reveal that the cap layer has not entirely covered the surface, but has formed rounded terracelike structures surrounding the QDs. A high current is detected on the QDs, about ten times less on the terraces, and not detectable on the wetting layer. Charges can be trapped inside the QDs and the surrounding terraces in forward bias conditions with a temporary memory effect and discharged in reverse bias. (c) 2006 American Institute of Physics.
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