Journal
APPLIED SURFACE SCIENCE
Volume 252, Issue 22, Pages 8022-8027Publisher
ELSEVIER
DOI: 10.1016/j.apsusc.2006.04.028
Keywords
tetracene; thin films; synchrotron X-ray diffraction; flexible substrate
Ask authors/readers for more resources
Structural properties of tetracene thin films grown by vacuum sublimation on a flexible Mylar((c)) substrate have been investigated by means of synchrotron X-ray diffraction. The films are polycrystalline and are made up of crystalline domains oriented with the (0 0 l) planes almost parallel to the substrate and completely misoriented around the surface normal. Two crystallographic phases (alpha and beta thin film phases) have been identified. They differ for the d(h k l) interplanar spacing, both larger than that of the bulk. As a comparison, results from tetracene films grown on SiO2 have been reported to investigate the different charge transport properties of films grown on Mylar and on SiO2 substrates. (c) 2006 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available