Journal
SOLAR ENERGY MATERIALS AND SOLAR CELLS
Volume 90, Issue 15, Pages 2356-2361Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.solmat.2006.03.008
Keywords
thin films; X-ray diffraction; optical reflectance; nanocrystals
Ask authors/readers for more resources
Zinc oxide thin films were grown by potentiostatic electrodeposition at different bath temperatures (62-89 degrees C, and -1V vs. SCE) from a 0.1 M Zn(NO3)(2) solution. X-ray diffraction (XRD) shows there is crystallite size enlargement as bath temperature increases. The band gap energy values, determined from optical reflectance spectra, are between 3.2 and 3.3 eV, decreasing when the bath temperature increases. A quantum size effect is deduced from the correlation between the band gap energy and the crystallite size. (c) 2006 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available