Journal
APPLIED OPTICS
Volume 45, Issue 28, Pages 7309-7315Publisher
OPTICAL SOC AMER
DOI: 10.1364/AO.45.007309
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We investigate the influence of an additional scatterer on the tracking signal of an optically trapped particle. The three-dimensional particle position is recorded interferometrically with nanometer precision by using a quadrant photodiode in the back focal plane of a detection lens. A phase disturbance underneath the sample leads to incorrect position signals. The resulting interaction potential and forces are therefore erroneous as well. We present a procedure to correct for the disturbance by measuring its interferometric signal. We prove the applicability of our phase correction approach by generating a defined displacement of the trapped probe. (c) 2006 Optical Society of America.
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