Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 423, Issue 1-2, Pages 228-231Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2006.01.097
Keywords
magnetic films and multilayers; x-ray diffraction; magnetic measurements
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We investigated the role of strain on the magnetic properties of La0.7Sr0.3MnO3 epitaxial films grown on substrates with different crystallographic orientation. The magnetic characterization confirms the large magnetostriction due to the tensile stress applied by the SrTiO3 substrates. The data demonstrate that the easy direction of magnetization is aligned to the elongated, in-plane axis both in (110)- and (001)-oriented films. The in-plane anisotropy of (110) films is interpreted in the frame of a simple structural model. We provide evidence of a spatial separation between a conducting ferromagnetic and an insulating paramagnetic phase at the Curie temperature. The possible effect of such phase separation on the coercitive field and on the magnetization versus temperature is discussed. (c) 2006 Elsevier B.V. All rights reserved.
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