Journal
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
Volume 23, Issue 11, Pages 2880-2887Publisher
OPTICAL SOC AMER
DOI: 10.1364/JOSAA.23.002880
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The transmittance of thin films of Sc deposited by evaporation in ultrahigh vacuum conditions has been investigated in the 20-1000 eV spectral range. Transmittance measurements were performed in situ on Se layers that were deposited over grids coated with a C support film. Transmittance measurements were used to obtain the extinction coefficient of Sc films at each individual photon energy investigated. These data, along with the data available in the literature for the rest of the spectrum, were used to obtain the refractive index of Sc by means of the Kramers-Kronig analysis. Sum-rule tests indicated an acceptable consistency of the data. (c) 2006 Optical Society of America
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