Journal
BULLETIN OF MATERIALS SCIENCE
Volume 29, Issue 6, Pages 605-609Publisher
INDIAN ACADEMY SCIENCES
DOI: 10.1007/s12034-006-0011-4
Keywords
polymethyl methacrylate (PMMA); ion irradiation; dielectric properties; microhardness; Mossbauer spectroscopy; AFM
Categories
Ask authors/readers for more resources
Thin films of polymethyl methacrylate (PMMA) were synthesized. Ferric oxalate was dispersed in PMMA films. These films were irradiated with 80 MeV O6+ ions at a fluence of 1 x 10(11) ions/cm(2). The radiation induced changes in electrical conductivity, Mossbauer parameter, microhardness and surface roughness were investigated. It is observed that hardness and electrical conductivity of the film increases with the concentration of dispersed ferric oxalate and also with the fluence. It indicates that ion beam irradiation promotes (i) the metal to polymer bonding and (ii) convert the polymeric structure into hydrogen depleted carbon network. Thus irradiation Makes the polymer harder and more conductive. Before irradiation, no Mossbauer absorption was observed. The irradiated sample showed Mossbauer absorption, which seems to indicate that there is significant interaction between the metal ion and polymer matrix. Atomic force microscopy shows that the average roughness (R-a) of the irradiated film is lower than the unirradiated one.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available