Journal
APPLIED PHYSICS LETTERS
Volume 89, Issue 22, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2397561
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A method has been developed and applied to measure the beam waist and spot size of a focused soft x-ray beam at the free-electron laser FLASH of the Deutsches Elektronen-Synchrotron in Hamburg. The method is based on a saturation effect upon atomic photoionization and represents an indestructible tool for the characterization of powerful beams of ionizing electromagnetic radiation. At the microfocus beamline BL2 at FLASH, a full width at half maximum focus diameter of (15 +/- 2) mu m was determined. (c) 2006 American Institute of Physics.
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