Journal
MICROSCOPY RESEARCH AND TECHNIQUE
Volume 69, Issue 12, Pages 998-1004Publisher
WILEY
DOI: 10.1002/jemt.20379
Keywords
manipulation; dissection; lithography; tapping mode atomic force microscope; AFM
Categories
Ask authors/readers for more resources
A modified tapping mode of the atomic force microscope (AFM) was introduced for manipulation, dissection, and lithography. By sufficiently decreasing the amplitude of AFM tip in the normal tapping mode and adjusting the setpoint, the tip-sample interaction can be efficiently controlled. This modified tapping mode has some characteristics of the AFM contact mode and can be used to manipulate nanoparticles, dissect biomolecules, and make lithographs on various surfaces. This method did not need any additional equipment and it can be applied to any AFM system.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available