4.6 Article

The structural and electrical property of CuCr1-xNixO2 delafossite compounds

Journal

MATERIALS LETTERS
Volume 60, Issue 29-30, Pages 3871-3873

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.matlet.2006.03.132

Keywords

transparent conducting oxides; Raman spectroscopy; electrical property; transport mechanism; X-ray photoelectron spectroscopy; Seekbeck coefficient

Ask authors/readers for more resources

A series of CuCr1-xNixO2 (0 <= x <= 0.06) polycrystalline samples was prepared. The electrical conductivity was measured in the temperature range of 160-300 K. It was found that the electrical conductivity (or) increases rapidly with the doping of Ni2+ ions. At room temperature, the sigma is 0.047 S cm(-1) for the sample with x=0.06, which is two orders of magnitude larger than that of the CuCrO2 sample (9.49E-4 S cm(-1)). The Seebeck coefficients are positive for all samples, which indicate p-type conducting of the samples. The experimental results imply that it is possible to get higher electrical conductivity p-type transparent conducting oxides (TCO) from CuMO2 by doping with divalent ions. (c) 2006 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available