Journal
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA
Volume 103, Issue 49, Pages 18401-18404Publisher
NATL ACAD SCIENCES
DOI: 10.1073/pnas.0608827103
Keywords
hydrophobicity; interfacial water; x-ray reflectivity
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The knowledge of the microscopic structure of water at interfaces is essential for the understanding of interfacial phenomena in numerous natural and technological environments. To study deeply buried liquid water-solid interfaces, high-energy x-ray reflectivity measurements have been performed. Silicon wafers, functionalized by a self-assembled monolayer of octadecyltrichlorosilane, provide strongly hydrophobic substrates. We show interfacial density profiles with angstrom resolution near the solid-liquid interface of water in contact with an octadecyltrichlorosilane layer. The experimental data provide clear evidence for the existence of a hydrophobic gap on the molecular scale with an integrated density deficit rho d = 1.1 angstrom g cm(-3) at the solid-water interface. In addition, measurements on the influence of gases (Ar, Xe, Kr, N-2, O-2, CO, and CO2) and HCl, dissolved in the water, have been performed. No effect on the hydrophobic water gap was found.
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