Journal
APPLIED PHYSICS LETTERS
Volume 89, Issue 24, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.2403183
Keywords
-
Categories
Ask authors/readers for more resources
The authors present a two-dimensional electron heterostructure field effect device of simplistic design and ease of fabrication that displays high mobility electron transport. This is accomplished using a high efficacy contacting scheme and simple metallic overlapping gate, obviating dopant layers. The resultant devices demonstrate adjustable electron densities and mobilities larger than 8x10(6) cm(2)/V s at the highest densities of 2.4x10(11)/cm(2). This device type provides an experimental avenue for studying electron correlations and may answer demands for routine fabrication of practical high electron mobility transistors. (c) 2006 American Institute of Physics.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available